Equotip enables portable hardness inspection of almost any object, polished parts and heat-treated surfaces. The hardness measurements are made by using the dynamic rebound testing method according to Leeb, the static Portable Rockwell hardness test and the Ultrasonic Contact Impedance (UCI) method. The rugged Swiss-made metal NDT hardness testers are designed for portable hardness testing in the lab, in the workshop, at production facilities or on site. Equotip Live is the latest innovation featuring a wireless impact device, mobile app, real-time data sharing and cloud backup.
Inventors of the Leeb Hardness Testing Principle in 1975
Since Proceq invented the Leeb hardness test principle in 1975, Equotip has become established as a globally recognized brand for portable hardness testing and a de facto industry standard. A wide range of different impact devices, as well as a comprehensive selection of test blocks and accessories cover most applications.
Leeb HL (Leeb)
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UCI
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Rockwell
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| Equotip Piccolo 2 / Bambino 2 | ||
| D, DL | - | - |
| Equotip Live Leeb | Equotip Live UCI | |
| D | 3-in-1 (HV 1, HV 5 & HV 10) | - |
| Equotip 550 Portable Ecosystem (w/ corresponding probe/impact device) | ||
| C, D, DC, DL, E, G, S | 3-in-1 (HV 1, HV 5 & HV 10) | 50 N (10 N + 40 N) |
The Equotip Ultra-portable Devices
Enhanced portability and multiple uses make these portable Equotip solutions the ideal entry alternative that fits the palm of your hand. Covering many use cases and even enabling Workspace App data sharing in the case of the Equotip LIVE Leeb and UCI.
The Equotip 550 Ecosystem
The portable top-notch hardness testing ecosystem with the most comprehensive coverage of hardness testing applications compatible with all our Leeb, UCI & Rockwell probes and matching accessories.
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Configure & Customize
Configure and customize the Equotip 550 ecosystem and cover as many applications as you wish by selecting all the specific probes that are suitable for the each application
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The Portable Equotip 550
Measuring Performance
High accuracy
Custom conversions
Combined methods
Powerful Hardware
Rugged housing
High capacity battery
Versatile connectivity
Easy to use
Large touchscreen
Personalized views
Custom reports
Portable hardness testers
Leeb
Rockwell
UCI
Equotip 550
Portable Hardness
356 10 001
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Add Your Equotip 550 Compatible Hardness Testers
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| Main scope of application | Most commonly used probe. For the majority of applications. | Narrow indenter (probe) tip for measurement on hard reach areas or spaces with limited access. | Restricted areas | Large and heavy components, e.g. casts and forged parts. | For surface hardened components, coatings, thin or impact-sensitive parts. | For measurements in extreme hardness ranges. Tool steels with high carbide content. | For measurements in extreme hardness ranges. Tool steels with a high carbide content. | Very universal. Widely used for heat-treated surfaces,weld inspection. | Can measure very thin and light samples without mass restriction. |
| Probe | 356 00 100 Leeb D Impact Device |
356 00 120 Leeb DL Impact Device |
356 00 110 Leeb DC Impact Device |
356 00 300 Leeb G Impact Device |
356 00 500 Leeb C Impact Device |
356 00 400 Leeb E Impact Device |
356 00 200 Leeb S Impact Device |
356 00 800 UCI 3-in-1 Probe HV1-HV10 |
356 00 600 Portable Rockwell Probe 50N |
| Conversion scales | HB, HV, HRA, HRB, HRC, HS, MPA (σ1, σ2, σ3) | HLD, HB, HRC, HRA, HRB, HR15N, HR15T MPA (σ1, σ2, σ3) | HLD, HV, HB, HRA, HRB, HRC, HR15N, MPA (σ1, σ2, σ3) | ||||||
| Measurement range | 150-950 HLD | 640 - 950 HLDL | 150-950 HLDC | 295-760 HLG | 300-980 HLC | 290-930 HLE | 300-920 HLS | 20-2000 HV | 10-100 mm, 19-70 HRC |
| Indenter | Tungsten Carbide | Polycristalline diamond | Silicon Nitride | ISO 6507-2 compliant, 136° Vickers diamond | ASTM E3246 and DIN50157 compliant, 100°diamond | ||||
| Impact energy / Test force | 11 Nmm | 90 Nmm | 3 Nmm | 11 Nmm | 11 Nmm | HV1 (9.8 N), HV5 (49 N), HV10 (98N) in one probe | 50 N (10N + 40 N) | ||
| Accredited calibration | ISO/IEC 17025 | ||||||||
| Standard compliance | ASTM A956 DIN EN ISO 16859 GB/T 17394 JB/T 9378 | ASTM A1038 DIN 50159 GB/T 34205 | ASTM A3246 DIN 50157 | ||||||
| Measurement resolution | 1 HLD | 1 HLDL | 1 HLDC | 1 HLG | 1 HLC | 1 HLE | 1 HLS | 1 HV(UCI), 0.1 HRC | 0.1 μm; 0.1 HRC; 1 HV |
| Measuring accuracy | ± 4 HLx (0.5% @850 HLx) | ± 2% | ± 0.8 μm; ~ ± 1.0 HRC | ||||||
| Measurement deviation (E) | Lower than DIN EN ISO 16859 | Lower than DIN 50159 and GB/T 34205 | Lower than DIN 50157 and ASTM E3246 | ||||||
| Coefficient of variation (R) | Lower than DIN EN ISO 16859 | Lower than DIN 50159 and GB/T 34205 | Lower than DIN 50157 and ASTM E3246 | ||||||
| Add to cart | Add to cart | Add to cart | Add to cart | Add to cart | Add to cart | Add to cart | Add to cart | Add to cart | |
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Add Your Accessories, Test Blocks & Calibrations
Accessories
| Equotip Leeb Accessories | ||
|---|---|---|
| 353 03 000 | Set of Support Rings | Add to cart |
| 356 00 080 | Equotip Impact Device Cable 1.5 m (5 ft) | Add to cart |
| 353 00 086 | Equotip Impact Device Cable 5 m (15 ft) | Add to cart |
| Equotip UCI Accessories | ||
|---|---|---|
| 356 00 720 | Equotip UCI Special Foot | Add to cart |
| Equotip Portable Rockwell Accessories | ||
|---|---|---|
| 354 01 200 | Equotip Portable Rockwell Measuring Clamp | Add to cart |
| 354 01 130 | Equotip Portable Rockwell Tripod | Add to cart |
| 354 01 250 | Equotip Portable Rockwell Special Foot RZ 18 - 70 | Add to cart |
| 354 01 253 | Equotip Portable Rockwell Special Foot RZ 70 - ∞ | Add to cart |
| 354 01 243 | Equotip Portable Rockwell support Z2 for measuring clamp | Add to cart |
| 354 01 229 | Equotip Portable Rockwell Support Z4+28 for measuring clamp (for tubes and pipes over Ø 28 mm) | Add to cart |
| 354 01 228 | Equotip Portable Rockwell support Z4 for measuring clamp (for tubes and pipes up to Ø 28 mm) | Add to cart |
Test Blocks
| Equotip Leeb Test Blocks Calibrations | ||
|---|---|---|
| 357 11 500 | Equotip Test Block C, ~565 HLC / <220 HB | Add to cart |
| 357 12 500 | Equotip Test Block C, ~665 HLC / ~325 HB | Add to cart |
| 357 13 500 | Equotip Test Block C, ~835 HLC / ~56 HRC | Add to cart |
| 357 11 100 | Equotip Test Block D/DC, <500 HLD / <220 HB | Add to cart |
| 357 12 100 | Equotip Test Block D/DC, ~600 HLD / ~325 HB | Add to cart |
| 357 13 100 | Equotip Test Block D/DC, ~775 HLD / ~56 HRC | Add to cart |
| 357 13 105 | Equotip Test Block D/DC, ~775 HLD, one side | Add to cart |
| 357 11 120 | Equotip Test Block DL, <710 HLDL / <220 HB | Add to cart |
| 357 12 120 | Equotip Test Block DL, ~780 HLDL /~325 HB | Add to cart |
| 357 13 120 | Equotip Test Block DL, ~890 HLDL / ~56 HRC | Add to cart |
| 357 13 400 | Equotip Test Block E, ~740 HLE / ~56 HRC | Add to cart |
| 357 14 400 | Equotip Test Block E, ~810 HLE / ~63 HRC | Add to cart |
| 357 31 300 | Equotip Test Block G, <450 HLG / <200 HB | Add to cart |
| 357 32 300 | Equotip Test Block G, ~570 HLG / ~340 HB | Add to cart |
| 357 13 200 | Equotip Test Block S, ~815 HLS / ~56 HRC | Add to cart |
| 357 14 200 | Equotip Test Block S, ~875 HLS / ~63 HRC | Add to cart |
| Equotip Portable Rockwell Test Blocks | ||
|---|---|---|
| 357 41 100 | Equotip Portable Rockwell Test Block ~20 HRC, ISO 6508-3 HRC Calibration |
Add to cart |
| 357 42 100 | Equotip Portable Rockwell Test Block ~45 HRC, ISO 6508-3 HRC Calibration |
Add to cart |
| 357 44 100 | Equotip Portable Rockwell Test Block ~62 HRC, ISO 6508-3 HRC Calibration |
Add to cart |
| Equotip UCI Test Blocks | ||
|---|---|---|
| 357 51 200 | Equotip UCI Test Block ~300HV, ISO 6507-3 HV10 Calibration |
Add to cart |
| 357 52 200 | Equotip UCI Test Block ~550HV, ISO 6507-3 HV10 Calibration | Add to cart |
| 357 54 200 | Equotip UCI Test Block ~850HV, ISO 6507-3 HV10 Calibration | Add to cart |
Equotip Brochure
Additional Test Block Calibrations
| Factory Calibrations | ||
|---|---|---|
| 357 10 109 | Equotip Leeb Test Block Additional Calibration HLD / HLDC | Add to cart |
| 357 10 129 | Equotip Leeb Test Block Additional Calibration HLDL | Add to cart |
| 357 10 209 | Equotip Leeb Test Block Additional Calibration HLS | Add to cart |
| 357 10 409 | Equotip Leeb Test Block Additional Calibration HLE | Add to cart |
| 357 10 509 | Equotip Leeb Test Block Additional Calibration HLC | Add to cart |
| 357 30 309 | Equotip Leeb Test Block Additional Calibration HLG | Add to cart |
| Portable Rockwell By Accredited Institutes | ||
|---|---|---|
| 357 90 918 | Equotip Portable Rockwell Test Block Additional Calibration HB (ISO 6506-3) | Add to cart |
| 357 90 928 | Equotip Portable Rockwell Test Block Additional Calibration HV (ISO 6507-3) | Add to cart |
| Leeb By Accredited Institutes | ||
|---|---|---|
| 357 90 909 | Equotip Leeb Test Block Additional Calibration HL (DIN 50156-3) | Add to cart |
| 357 90 919 | Equotip Leeb Test Block Additional Calibration HB (ISO 6506-3) | Add to cart |
| 357 90 929 | Equotip Leeb Test Block Additional Calibration HV (ISO 6507-3) | Add to cart |
| 357 90 939 | Equotip Leeb Test Block Additional Calibration HR (ISO 6508-3) | Add to cart |
| UCI By Accredited Institutes | ||
|---|---|---|
| 357 90 940 | Equotip UCI Test Block Additional Calibration HB, ISO 6506-3, one side | Add to cart |
| 357 90 941 | Equotip UCI Test Block Additional Calibration HR, ISO 6508-3, one side | Add to cart |
| 357 52 100 | Equotip UCI Test Block ~550HV, ISO 6507-3 HV5 Calibration | Add to cart |
